Conference

45th IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2016)

The 45th IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2016) will be held in Washington DC, USA on October 18–20, 2016.

Scope

Topics of interest include:

  • Image retrieval and scene modeling
  • AI tools for assisted image analysis
  • Video analytics
  • Biometrics
  • Surveillance
  • Medical and biological applications
  • Anomaly detection
  • Image-based autonomous capabilities in transportation and medicine
  • (See full list on the official website)

Most important dates

  • Submission deadline: June 30, 2016
  • Starting date: October 18, 2016
  • End date: October 20, 2016

Contact information

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